• Jeol developed the JCM-7000Plus NeoScope benchtop scanning electron microscope, with sales set to start Sept. 1, 2026.
• Expanded landing voltage to 20 kV, lifting stated resolution to 6 nm for secondary electron imaging, supporting higher-magnification measurement.
• Added automation functions, including Neo Action, to streamline operation for research, manufacturing inspection, and education use cases.
• Introduced Live Particle for real-time particle sizing and counting, targeting faster routine analysis workflows.
• Set a sales target of 300 units a year.

Disclaimer: This news brief was created by Public Technologies (PUBT) using generative artificial intelligence. While PUBT strives to provide accurate and timely information, this AI-generated content is for informational purposes only and should not be interpreted as financial, investment, or legal advice. Jeol Ltd. published the original content used to generate this news brief via Business Wire (Ref. ID: 202609010330BIZWIRE_USPR_____20260825_BW564112) on September 01, 2026, and is solely responsible for the information contained therein.